- English
- فارسی
Oloomi, A., Sabounchi, A., and Sedaghat, A., Parametric Study of Nanoscale Radiative Properties of Thin Film Coatings, Nano Trends: A Journal of Nanotechnology and its Application, 7(3) 1-7, 2009.
Nano Trends: A Journal of Nanotechnology and its Applications
Volume 7, Issue 3, December, 2009, Pages 1-7
ISSN 0973-418X © NSTC 2010. All Rights Reserved Page 1
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Parametric Study of Nanoscale Radiative Properties of Thin Film Coatings
S.A.A.Oloomi ,* A.Saboonchi and A. Sedaghat
Department of Mechanical Engineering, Isfahan University of Technology, Isfahan, Iran
Abstract
The ability to manufacture, control, and manipulate structures at extremely small scales is the hallmark of modern
technologies. In this Paper, the directional, spectral, and temperature dependency of the radiative properties for the Nanoscale multilayer structures are modeled consisting of silicon and related materials such as silicon dioxide, and silicon nitride. Results showed that maximum transmittance depends on the type of materials coatings and its temperature. The reflectance decreases as the temperature increases, because of increasing emittance. The coatings act as wavelength selective emitters for radiative energy conversion and thermal radiation detection.
Keywords: Thickness, Temperature, Thin Film, Nanoscale, Multilayer, Coherent Formulation.
Journal Papers
Month/Season:
December
Year:
2009
